電軌探棒
電軌探棒
這些探棒結合低雜訊貢獻、最高 60 V 的直流偏移、高頻寬、低負載和多種連接替代方案，對電源完整性量測進行了最佳化。
Why use a power rail probe over a passive or differential probe?
Traditional power integrity applications typically use passive or differential probes to measure power rails. The changing technology landscape means designers need higher accuracy ripple measurements with very fast transitions pushing into multiple GHz range. New design challenges call for new measurement equipment that can minimize noise from the measurement tools while also offering more bandwidth to see more signal content. The ultra-low noise TPR1000/4000 power rail probe offers low loading for accuracy (especially in the most sensitive measurements) and offers low noise contribution and high bandwidth options.
More data, faster signals
The new power rail probe covers power rail transient events up to 4 GHz and offers offset voltage range of ±60V to measure power supplies from plug, down to the pin of an integrated circuit. It also offers a wide dynamic range of ±1V, which, on higher voltage rails, lets you look at droop on the line or when a lot of current is drawn by load or transients. Coupled with the right scope, this powerful combination means you don’t have to worry if the noise you are seeing is from your test equipment or if you’re seeing aggressors in your system that you could never see before.
Overcoming the connectivity challenge
Power engineers are challenged to get more power efficiency from smaller and tighter designs. This is especially true for engineers in the automotive, industrial and consumer markets where typical validation requires probing at least 1 or more rails in parallel with other signals. This creates new constraints on connectivity due to tight spacing, buried signals, and smaller geometry components.
The power rail probe comes with modular and flexible connectivity options to cover most needs. Now, when you’re soldering to a surface-mount component connected to a power rail, you have the MMCX lock-snap connections that make test set-up a breeze.
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